M. F. Doemling
About
M. F. Doemling has authored 7 papers that have received a total of 428 indexed citations.
This includes 7 papers in Electrical and Electronic Engineering, 4 papers in Electronic, Optical and Magnetic Materials and 2 papers in Biomedical Engineering. The topics of these papers are Plasma Diagnostics and Applications (4 papers), Semiconductor materials and devices (4 papers) and Copper Interconnects and Reliability (4 papers). M. F. Doemling is often cited by papers focused on Plasma Diagnostics and Applications (4 papers), Semiconductor materials and devices (4 papers) and Copper Interconnects and Reliability (4 papers) and collaborates with scholars based in United States. M. F. Doemling's co-authors include G. S. Oehrlein, N. R. Rueger, M. Schaepkens, JJ Beulens and T. E. F. M. Standaert and has published in prestigious journals such as Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and IBM Journal of Research and Development
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