N. Jarwala

4 papers and 20 indexed citations i.

N. Jarwala has authored 4 papers that have received a total of 20 indexed citations. This includes 4 papers in Hardware and Architecture, 3 papers in Control and Systems Engineering and 2 papers in Electrical and Electronic Engineering. The topics of these papers are VLSI and Analog Circuit Testing (4 papers), Fault Diagnosis in Complex Systems (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (2 papers). N. Jarwala is often cited by papers focused on VLSI and Analog Circuit Testing (4 papers), Fault Diagnosis in Complex Systems (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (2 papers) and collaborates with scholars based in United States. N. Jarwala's co-authors include Benoit Nadeau-Dostie, Rodham E. Tulloss, Dhiraj K. Pradhan and C.W. Yau and has published in prestigious journals such as Computer, IEEE Transactions on Computers and Journal of Electronic Testing