Tom Wallow

30 papers and 277 indexed citations i.

Tom Wallow has authored 30 papers that have received a total of 277 indexed citations. This includes 29 papers in Electrical and Electronic Engineering, 20 papers in Surfaces, Coatings and Films and 5 papers in Biomedical Engineering. The topics of these papers are Advancements in Photolithography Techniques (29 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Electron and X-Ray Spectroscopy Techniques (18 papers). Tom Wallow is often cited by papers focused on Advancements in Photolithography Techniques (29 papers), Integrated Circuits and Semiconductor Failure Analysis (21 papers) and Electron and X-Ray Spectroscopy Techniques (18 papers) and collaborates with scholars based in United States, South Korea and Canada. Tom Wallow's co-authors include Bruno La Fontaine, Patrick Naulleau, Christopher N. Anderson, Kenneth A. Goldberg and Paul Denham and has published in prestigious journals such as Microelectronic Engineering, Journal of Micro/Nanolithography MEMS and MOEMS and Journal of Photopolymer Science and Technology