T.W. Williams

23 papers and 757 indexed citations i.

T.W. Williams has authored 23 papers that have received a total of 757 indexed citations. This includes 21 papers in Hardware and Architecture, 20 papers in Electrical and Electronic Engineering and 5 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Fault Diagnosis in Complex Systems (5 papers). T.W. Williams is often cited by papers focused on VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Fault Diagnosis in Complex Systems (5 papers) and collaborates with scholars based in United States, Germany and Switzerland. T.W. Williams's co-authors include Wilfried Daehn, R. Kapur, M.R. Mercer, Nahmsuk Oh and Samitha Samaranayake and has published in prestigious journals such as Proceedings of the IEEE, IEEE Transactions on Industrial Electronics and Computer