Wilfried Daehn

15 papers and 187 indexed citations i.

Wilfried Daehn has authored 15 papers that have received a total of 187 indexed citations. This includes 13 papers in Hardware and Architecture, 11 papers in Electrical and Electronic Engineering and 3 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Software Testing and Debugging Techniques (3 papers). Wilfried Daehn is often cited by papers focused on VLSI and Analog Circuit Testing (13 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Software Testing and Debugging Techniques (3 papers) and collaborates with scholars based in Germany, United States and Canada. Wilfried Daehn's co-authors include T.W. Williams, A. Ivanov, V.K. Agarwal, K.D. Wagner and T.W. Williams and has published in prestigious journals such as IEEE Transactions on Computers, IBM Journal of Research and Development and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems