Xiaoqing Wen

124 papers and 1.3k indexed citations i.

Xiaoqing Wen has authored 124 papers that have received a total of 1.3k indexed citations. This includes 111 papers in Electrical and Electronic Engineering, 80 papers in Hardware and Architecture and 9 papers in Control and Systems Engineering. The topics of these papers are VLSI and Analog Circuit Testing (75 papers), Integrated Circuits and Semiconductor Failure Analysis (56 papers) and Radiation Effects in Electronics (50 papers). Xiaoqing Wen is often cited by papers focused on VLSI and Analog Circuit Testing (75 papers), Integrated Circuits and Semiconductor Failure Analysis (56 papers) and Radiation Effects in Electronics (50 papers) and collaborates with scholars based in Japan, China and France. Xiaoqing Wen's co-authors include Aibin Yan, Zhengfeng Huang, Jie Cui, Patrick Girard and Tianming Ni and has published in prestigious journals such as Journal of Hazardous Materials, IEEE Access and ACM Computing Surveys