Yannick Bonhomme
About
Yannick Bonhomme has authored 11 papers that have received a total of 48 indexed citations.
This includes 11 papers in Electrical and Electronic Engineering, 7 papers in Hardware and Architecture and 1 paper in Artificial Intelligence. The topics of these papers are VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Radiation Effects in Electronics (3 papers). Yannick Bonhomme is often cited by papers focused on VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Radiation Effects in Electronics (3 papers) and collaborates with scholars based in France, Switzerland and United States. Yannick Bonhomme's co-authors include A. Virazel, L. Guiller, S. Pravossoudovitch, Patrick Girard and C. Landrault and has published in prestigious journals such as Journal of Electronic Testing
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