Ke Huang
About
Ke Huang has authored 42 papers that have received a total of 609 indexed citations.
This includes 21 papers in Electrical and Electronic Engineering, 15 papers in Hardware and Architecture and 8 papers in Industrial and Manufacturing Engineering. The topics of these papers are Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (8 papers) and Semiconductor materials and devices (5 papers). Ke Huang is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (8 papers) and Semiconductor materials and devices (5 papers) and collaborates with scholars based in United States, China and France. Ke Huang's co-authors include John M. Carulli, Yiorgos Makris, Jie Wu, Nathan Kupp and Haralampos‐G. Stratigopoulos and has published in prestigious journals such as Proceedings of the IEEE, Information Sciences and IEEE Transactions on Electron Devices.
In The Last Decade
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